发明名称 FAULT INSPECTION DEVICE OF BYPASS DIODE
摘要 PROBLEM TO BE SOLVED: To provide a fault inspection device of a bypass diode, capable of detecting a fault of a bypass diode without damaging solar cell clusters that are connected in parallel.SOLUTION: An anode side terminal 1 is connected to a negative electrode side of a solar cell string 110. A cathode side terminal 2 is connected to a positive electrode side of the solar cell string 110. A voltage source 3 applies a sweep voltage directing from a low voltage side to a high voltage side on the solar cell string 110 connected between the anode side terminal 1 and the cathode side terminal 2, in a forward direction of bypass diodes 131, 132, 133 that are included in the solar cell string 110. A current detection section 4 detects a current amount flowing through the solar cell string 110 that is connected between the anode side terminal 1 and the cathode side terminal 2. A current cut-off section 5 cuts off a current flowing through the solar cell string 110 when the current detection section 4 detects an upper limit current amount specified in advance.SELECTED DRAWING: Figure 1
申请公布号 JP2016208621(A) 申请公布日期 2016.12.08
申请号 JP20150086103 申请日期 2015.04.20
申请人 NIPPON KERNEL SYSTEM CO LTD 发明人 ASAI JUN;HIRAO KAZUYUKI
分类号 H02S50/10 主分类号 H02S50/10
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