NON-HOMOGENEOUS SAMPLE SCANNING APPARATUS, AND X-RAY ANALYZER APPLICATIONS THEREOF

摘要

A sample scanning apparatus/technique/method for a material analyzer, including moving a sample cell containing a sample over a measurement focal area of the analyzer according to a scan pattern, thereby scanning the sample over the measurement focal area in the scan pattern, and exposing multiple areas of the sample to the focal area. A sample cell rotator for rotating a sample cell is provided; along with a linear motion stage. The combined rotation and linear movement results in scanning the sample over the focal area in a scan pattern, thereby exposing multiple areas of the sample to the focal area. The sample scanning apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.

主权项

1. A sample scanning apparatus for a material analyzer, comprising:
a sample cell rotator for rotating a sample cell containing a sample over a measurement focal area of the analyzer; and a linear motion stage for linearly moving the rotating rotator and sample cell over the measurement focal area;wherein the combined rotation and linear movement of the sample cell over the measurement focal area of the analyzer results in scanning the sample over the measurement focal area in a scan pattern across the sample, thereby exposing multiple areas of the sample in the sample cell to the measurement focal area.