发明名称 Automated analytics systems and methods
摘要 An automated analytics system can include a sensor system that obtains measurement data by monitoring one or more parameters at each of a number of locations on each of a number of replicated components of an object. A computing device receives the measurement data from the sensor system and uses the measurement data to automatically generate a computerized representation of each of the plurality of replicated components. Thereafter, upon receipt of an input query, the computing device generates a synthesized representation of the object that is specifically directed to a parameter of interest indicated in the query. The synthesized representation may be displayed in a visual format that is interpretable by a human to derive information associated with the parameter of interest.
申请公布号 US9459153(B2) 申请公布日期 2016.10.04
申请号 US201414488873 申请日期 2014.09.17
申请人 General Electric Company 发明人 Patrick Romano;Vittal Sameer;Cristofoli Gary;Reimann Johan Michael
分类号 G06T15/00;G01J5/00 主分类号 G06T15/00
代理机构 Sutherland Asbill & Brennan LLP 代理人 Sutherland Asbill & Brennan LLP
主权项 1. An automated analytics method comprising: using a sensor system to obtain measurement data by monitoring one or more parameters at a plurality of locations on each of a plurality of replicated components of an object; providing to a computing device, the measurement data; using the measurement data to automatically generate in the computing device, a first computerized representation of at least one of the plurality of replicated components; generating, based on a geometric computer model, a second computerized representation of the at least one of the plurality of replicated components; receiving in the computing device, a first input query comprising a first parameter of interest; and responding to the first input query by comparing the first computerized representation to the second computerized representation and generating a first synthesized representation of at least a portion of the object, the first synthesized representation providing information specifically directed to the first parameter of interest.
地址 Schenectady NY US