发明名称 |
Automated analytics systems and methods |
摘要 |
An automated analytics system can include a sensor system that obtains measurement data by monitoring one or more parameters at each of a number of locations on each of a number of replicated components of an object. A computing device receives the measurement data from the sensor system and uses the measurement data to automatically generate a computerized representation of each of the plurality of replicated components. Thereafter, upon receipt of an input query, the computing device generates a synthesized representation of the object that is specifically directed to a parameter of interest indicated in the query. The synthesized representation may be displayed in a visual format that is interpretable by a human to derive information associated with the parameter of interest. |
申请公布号 |
US9459153(B2) |
申请公布日期 |
2016.10.04 |
申请号 |
US201414488873 |
申请日期 |
2014.09.17 |
申请人 |
General Electric Company |
发明人 |
Patrick Romano;Vittal Sameer;Cristofoli Gary;Reimann Johan Michael |
分类号 |
G06T15/00;G01J5/00 |
主分类号 |
G06T15/00 |
代理机构 |
Sutherland Asbill & Brennan LLP |
代理人 |
Sutherland Asbill & Brennan LLP |
主权项 |
1. An automated analytics method comprising:
using a sensor system to obtain measurement data by monitoring one or more parameters at a plurality of locations on each of a plurality of replicated components of an object; providing to a computing device, the measurement data; using the measurement data to automatically generate in the computing device, a first computerized representation of at least one of the plurality of replicated components; generating, based on a geometric computer model, a second computerized representation of the at least one of the plurality of replicated components; receiving in the computing device, a first input query comprising a first parameter of interest; and responding to the first input query by comparing the first computerized representation to the second computerized representation and generating a first synthesized representation of at least a portion of the object, the first synthesized representation providing information specifically directed to the first parameter of interest. |
地址 |
Schenectady NY US |