发明名称 SAMPLING POSITION DISPLAY DEVICE AND SAMPLING METHOD.
摘要 In a sampling method according to the present invention, the coordinates (position information) of a sampling position of a sampling specimen (G) are generated randomly by a PC or other control unit (12) for a sampling position display device (10), and on the basis of the position information, laser light is used to display the sampling position on the sampling specimen (G), which constitutes a portion of material to be recycled. As a result, in increment sampling for determining the average quality, for example, the average valuable metal content, of a sampling specimen (G), it is possible to reliably eliminate arbitrariness resulting from the selection of a sampling position manually by an operator.
申请公布号 MX2016011778(A) 申请公布日期 2016.10.28
申请号 MX20160011778 申请日期 2014.06.16
申请人 MITSUBISHI MATERIALS CORPORATION 发明人 Akira NITTA;Michiaki ONISHI;Kenichi TOMIOKA;Tomohiro TSUTSUI;Makoto TAKAGI
分类号 G01N1/04;G01N1/28 主分类号 G01N1/04
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