发明名称 Dimension measuring apparatus
摘要 A device for accurately measuring a dimension associated with a remote object without contacting the object itself is disclosed. A beam of light is directed at a surface of the object and a reflected portion of the beam is detected at a photodetector element. The particular dimension of the object is determined mathematically by measuring the distance by which the reflected light signal is offset from a predetermined point on the photodetector which is aligned with a reference plane at the object. By the use of two heads and respective light beams and photodetectors, a remote object's thickness can also be measured. In order to compensate for the angular relationship between the object's surface and that of the photodetector, a linearizing calibration circuit is included in which preset corrections are recorded in programmable memory units. The calibration settings are determined during manufacture and correct for each normally non-linear reading at incremental distances within a prescribed measurement range. Further accuracy of the system is obtained by using a high frequency sampling circuit to modulate the light source, with a demodulating circuit serving to discriminate between the input light beam and extraneous ambient light signals.
申请公布号 US4375921(A) 申请公布日期 1983.03.08
申请号 US19800130171 申请日期 1980.03.13
申请人 SELECTIVE ELECTRONIC CO. AB 发明人 MORANDER, KARL-ERIK
分类号 G01C3/08;G01B11/02;G01B11/06;G01C3/06;(IPC1-7):G01B11/06;G01V1/02;G01D18/00 主分类号 G01C3/08
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