发明名称 DISPOSITIF DE MESURE D'UNE IMPEDANCE
摘要 <p>The appts. produces on image of the relaxation curve of a component under the influence of an electric perturbation, the image reproducing faithfully rapid impedance variations with a response time less than 100 nS. The appts. has an oscillator (1) emitting a carrier of known frequency and a pulse generator (2) emitting a polarisation signal with predetermined rise edge. A summation circuit (3) delivers a signal representing the sum of the oscillator and pulse generator signals to the impedance to be measured (C). The oscillator, pulse generator and summation circuit together form a dipole equivalent to a voltage generator having negligible output impedance w.r.t. the impedance to be measured. The appts. also has an amplifier (5) tuned to the carrier frequency and connected to the output of the impedance to be measured, an adjustable phase convertor (7) which receives the carrier signal and delivers a signal whose phase is adjustable w.r.t. the signal from the amplifier a demodulator (6) which receives signals from the amplifier and phase convertor and delivers a signal proportional to the product of these two signals to a low-pass filter (8) which eliminates the carrier frequency component.</p>
申请公布号 FR2514903(A1) 申请公布日期 1983.04.22
申请号 FR19810020096 申请日期 1981.10.21
申请人 CENTRE NAL RECHERC SCIENTIFIQUE 发明人 JEAN FARRE, ANDRE PEYREFITTE ET JEAN-CLAUDE SUBIELA;PEYREFITTE ANDRE;SUBIELA JEAN-CLAUDE
分类号 G01R27/02;G01R31/26;(IPC1-7):01R27/16;01R27/28 主分类号 G01R27/02
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