发明名称 Method for manufacturing integrated dynamic RAM one-transistor storage cells
摘要 Method for manufacturing dynamic RAM one-transistor storage cells in a semiconductor chip with each cell having one integrated field effect transistor and one integrated capacitor. A semiconductor substrate surface is covered in part by a thin oxide layer and in part by a thick oxide structure. The thin oxide layer is subjected to a first ion implantation. A doped polycrystalline semiconductor material is deposited over the entire surface. The polycrystalline layer is structured by means of a photoresist mask and the underlying layers at the open places etched away to expose substrate surface. The mask is removed. A second thin oxide layer is created by oxidation over the entire surface. A second ion implantation implants ions in the second oxide layer. A second doped layer of polycrystalline material is deposited over the second layer. The second polycrystalline layer is structured by a suitable phototechnique to produce a polycrystalline structure semiconductor layer.
申请公布号 US4391032(A) 申请公布日期 1983.07.05
申请号 US19810282706 申请日期 1981.07.13
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 SCHULTE, HEINZ
分类号 H01L27/10;H01L21/822;H01L21/8242;H01L27/04;H01L27/108;H01L29/78;H01L29/92;(IPC1-7):H01L21/20;B01J17/00 主分类号 H01L27/10
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