| 摘要 |
PURPOSE:To elevate the flaw detection accuracy greatly with accurate information on object to be detected by providing a gate for setting a flaw detection section according to the direction of the ultrasonic beam incident position and setting a waveform signal discrimination level for detecting a varying level of a waveform signal. CONSTITUTION:When a flaw 20 is detected with an array type probe 1 contacting material 19 to be inspected, a sectorshaped scanning of ultrasonic beam indicates a reflected signal 22 from the bottom of the material 19 being inspected and a defect signal 23 reflected from the flaw 20. Here, the probe 1 is moved so that the scan line 24 can overlap the defect signal 23. A digitalized waveform signal 25 which has memory numbers G1-Gn in the direction of beam propagation path is memorized. A gate sets gate ranges Gi-Gk for the signal 25 leading to detection of the maximum digital value Pj. This enables the conversion of the crossover address Gj and a discrimination level 26 within the gate into a specified numeral to be indicated numerically as reflected echo height 30 and beam propagation value 31 on the CRT thereby improving the flaw detection accuracy greatly.
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