| 摘要 |
PURPOSE:To relieve defective bits, and to improve yield by arranging and fitting the number of bits more than the number of reading bits at precise reading pitches while using a plurality of bits in a large number of bits as one bit. CONSTITUTION:The line sensors of the number of 3520 bits more than the number of reading bits of 1760 bits required are arranged and fitted precisely. Accordingly, when a defect due to a film defect of an amorphous silicon film is generated in bits, in which there are photosensor elements 4, in the line sensors, currents are flowed only through the line of the defect bit by a defect bit cutting circuit 9 and either of a photo diode 2, a blocking diode 3 or its wiring pattern or the like of the defect is cut electrically, only the defective bit is brought to an unusable state, and the defect of the reading bits is relieved through reading by using residual bits paired with said defective bit. |
