| 摘要 |
PURPOSE:To perform the dividing test of a scan-designed logical circuit easily and quickly by selecting each latch or detour of a shift register with a scan-out function by changing a switch and enabling the selected latches only to make scan. CONSTITUTION:Latches L1-Ln of the shift register with the scan-out function or the detours to bypass these are selected corresponding to selection changeover of switches S1-Sn. Accordingly, the selected latches only can make scan and the desired dividing test of the scan-designed logical circuit is performed easily and quickly. |
