| 摘要 |
PURPOSE:To obtain a moire lattice with an uniform thickness at a high accuracy, by using a laser processing apparatus to work parallel groove or rectangular grooves at an equal pitch on a sample piece moving a fine laser light spot focused with a lens over the surface of the sample. CONSTITUTION:A sample piece 1 is fixed on a vertically and horizontally mobile base 4 and a laser processing apparatus 6 is used to make a fine spot focused with a lens 5 irradiate the sample piece 1 moving over the surface thereof. Thus, parallel grooves or rectangular grooves at an equal pitch are formed at the rate of about 500 per inch to make a heat resistance lattice 11a directly on the test piece. This enables the formation of a uniformized moire lattice eliminating the need for coating a photosensitive film on the test piece for lattice baking and electrolytic grinding thereby preventing the deformation, peeling and the like of the moire lattice even under a high temperature above 200 deg.C that allows a higher strain gauging accuracy.
|
