发明名称 SEPARATION BETWEEN WAFER AND MASK
摘要 PURPOSE:To separate a wafer from a mask rapidly without fail doing no damage to the wafer by a method wherein a vacuum chuck for adsorbing the wafer is separated from the wafer in non-adsorbing state and then the mask is vacuumized downward to be bent upward so that a part or all part of wafer may be peeled off. CONSTITUTION:A wafer 1 and a mask 5 are vacuum-adsorbed and then the wafer 1 is pushed up by a chuck 3 to augment adhesion for exposure process. After finishing the exposure processing, the chuck 3 only is lowered with the vacuum state held as it is. The mask 5 starts bending upward due to the vacuum adsorption (F1) making gaps from the wafer 1. Resultantly, the wafer 1 adhered to the mask 5 can be peeled off from the peripheral parts. Finally the wafer 1 completely peeled off falls down on the chuck 3 to be reset to the original position by releasing the vacuum adsorption.
申请公布号 JPS62112326(A) 申请公布日期 1987.05.23
申请号 JP19850252519 申请日期 1985.11.11
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 MATSUMOTO HIDEYA
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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