| 摘要 |
PURPOSE:To successively set the initial test bias current value of a plurality of semiconductive elements in the measuring order of the previous process, by recording the measuring results of a plurality of the semiconductive elements measured in the previous process and reading memory content in the measuring order of the previous process. CONSTITUTION:The measuring result of a plurality of semiconductive elements measured in the previous process are recorded on a floppy disk 16. Data necessary for setting the initial test bias current of the semiconductive element 4 to be tested are read from the disk 16 in the measuring order of the previous process by the command from CPU13 and processed while the reference voltage of a differential amplifier is outputted to the output of a D/A converter 9. The voltage at both terminals of a current detection resistor 7 are detected by a digital voltmeter 8 and, when the initial bias current value of the element 4 read from the disk 16 coincides with the signal output of the meter, a latch circuit 12 latches the converter 9. By this method, the initial bias current values of a large number of semiconductive elements to be tested can be set accurately and rapidly.
|
