| 摘要 |
PURPOSE:To achieve a highly accurate measurement of fluorescence light, by providing a fluorescence light measuring device with a scattered light measuring section for measuring the intensity thereof to correct the effect of the intensity of scattered lights when greatly affecting the highly accurate measurement and quantitative assay of fluorescence light. CONSTITUTION:Radiation 2 from a light source 1 such as high pressure xenon lamp is focused with a lens 3 to be introduced to an excitation wavelength selector 4. An excitation light 5 analyzed with the excitation wavelength selector 4 is focused with a lens 6 to irradiate a sample 7. Fluorescence and scattered light from the sample 7 are collimated with a lens 8 and the lights are made incident on a dichroic mirror 9 which transmits fluorescence component of the light while reflecting the scattered light component thereof in the direction of 45 deg. to separate the fluorescence 10 from the scattered light 11. These lights are focused with lenses 12 and 13 to be introduced to a fluorescence wavelength selector 14 and a scattered light wavelength selector 15 to analyze and then, the intensities of the fluorescence light and the scattered light are measured respectively with photodetectors 16 and 17 such as photoelectric multiplier tube. The measured values thus obtained are sent to a correction computing section 18 to calculate the correct intensity of fluorescence using a specified formula and results are recorded on a recorder 19.
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