| 摘要 |
PURPOSE:To simplify a measuring operation and to enhance the measuring accuracy by a method wherein more than one pad used to extract a terminal required to measure the characteristic of a function block are installed at individual single-function block circuits in a semiconductor circuit and a necessary circuit is constituted by connecting the pads by using a wire after the characteristic has been measured. CONSTITUTION:Terminals required for a measuring operation are extracted from pads 3a-3c at individual single-function block circuits; the function block circuits are measured via the pads 3a-3c; after that, required terminals at the function block circuits are connected by making use of the pads 3a-3c and frames 9a, 9b during an assembly stage so that an actually usable circuit can be formed. By this setup, it is possible to simply measure the characteristic of the function block circuits and to supervise the characteristic with high accuracy. |
