发明名称 Process and apparatus for low pressure chemical vapor deposition of refractory metal
摘要 A process and apparatus for the low pressure, cold wall, chemical vapor deposition of refractory metals, such as tungsten on a silicon wafer. The silicon wafer is introduced into a loading lock wherein the pressure is reduced to subatmospheric pressure. The silicon wafer is transferred to a deposition chamber where it is heated to an elevated temperature. A refractory metal carbonyl vapor is introduced into the deposition chamber and dissociates to deposit a refractory metal on the silicon wafer. The wafer is transferred to an unloading lock where it is allowed to cool and is then removed.
申请公布号 US4817557(A) 申请公布日期 1989.04.04
申请号 US19870092967 申请日期 1987.09.04
申请人 ANICON, INC. 发明人 DIEM, MICHAEL;FISK, MICHAEL A.;GOLDMAN, JON C.
分类号 C23C16/54;H01L21/285;(IPC1-7):C23C16/00 主分类号 C23C16/54
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