发明名称 Process for etch of tungsten
摘要 A process for etch of tungsten which utilizes both in situ and remote plasmas, and a gas mixture for the plasma which comprises SF6, HBr, and a source of hydrocarbons at low pressure and ambient temperature to product an etch which is both selective to silicon dioxide and photoresist and anisotropic.
申请公布号 US4842676(A) 申请公布日期 1989.06.27
申请号 US19870122605 申请日期 1987.11.17
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 JUCHA, RHETT B.;DAVIS, CECIL J.;LOEWENSTEIN, LEE M.
分类号 C23F4/00;H01L21/3213 主分类号 C23F4/00
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