发明名称 DETERMINING RESISTIVE STATE OF MEMRISTORS
摘要 Example implementations relate to determining resistive state of memristors in a crossbar memory. For example, a method includes biasing each row of memristors and each column of memristors of the crossbar memory with a first voltage, and biasing a target column of memristors corresponding to the memristor with a second voltage to determine background current flowing through the target column of memristors. The method also includes increasing the first voltage for the reference array of memristors up to a third voltage such that the current flowing through the target column is a first current, and switching between the third voltage of the reference array of memristors and the first voltage of a target row of memristors corresponding to the memristor. The method also includes determining a second current flowing through the target column and comparing the second current with the first current to identify the resistive state of the memristor.
申请公布号 WO2016167785(A1) 申请公布日期 2016.10.20
申请号 WO2015US26281 申请日期 2015.04.17
申请人 HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP 发明人 JEON, Yoocharn
分类号 G11C13/00 主分类号 G11C13/00
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