发明名称 SYSTEMS AND METHODS FOR SUPER-RESOLUTION SURFACE-LAYER MICROSCOPY USING MAGNETIC RESONANCE
摘要 Systems and methods for using and exploiting the effect of electromagnetic field distortions (skin effect) induced by conductive or semi-conductive materials or phases of matter in order to excite and detect spins at specific depths within such matter, with a selectivity of approximately 0.25δ. This technique allows the acquisition of a depth profile of a conductor with a resolution far exceeding that of any MRI experiment and without the use of external magnetic field gradients, thus it is appropriately called a super-resolution methodology. Furthermore, the sequence can be combined with other MR sequences or imaging techniques to take depth-dependent measurements. At the heart of these super-resolution techniques lie not just the principle of reciprocity as formulated within the context of magnetic resonance, but also the specific dependence of the signal phases in response to propagation within conductive media.
申请公布号 WO2016168517(A1) 申请公布日期 2016.10.20
申请号 WO2016US27624 申请日期 2016.04.14
申请人 NEW YORK UNIVERSITY 发明人 JERSCHOW, Alexej;ILOTT, Andrew J.
分类号 G01B7/26;G01B7/02;G01B7/28;G01R33/12;G01R33/32;G01R33/422;G06F1/00 主分类号 G01B7/26
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