发明名称 PROCESS FOR PRODUCING FINE PATTERN
摘要 The fine pattern fabricating method using DUA (Deep Ultraviolet), g-line and i-line beam to form a pattern on the semiconductor wafer includes the first process forming the insolubility layer to alkali by softly baking the wafer on top of which the positive type photo resist layer is formed; the second step forming the fine patterns by exposing the beam to develop and heat treating the patterns.
申请公布号 KR940011204(B1) 申请公布日期 1994.11.26
申请号 KR19920002399 申请日期 1992.02.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, CHUN - KUN;NAM, JONG - RIM
分类号 G03F7/00;G03F7/26;(IPC1-7):G03F7/26 主分类号 G03F7/00
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