发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 <p>PURPOSE: To highly accurately and highly efficiently inspect the phase variation of timing signals even under a high-speed condition by incorporating a phase shift detecting circuit in an LSI which generates and processes a plurality of timing signals. CONSTITUTION: An LSI 100 is a clock distributing LSI which generates and outputs a plurality of timing signals (clock signals) Al-An of the uniform phase. In the LSI 100, a signal processing circuit 101 which generates the timing signals A1-An and a phase shift detecting circuit 1 which detects whether or not the maximum phase difference among the signals A1-An exceeds a prescribed range and outputs detected results to the outside are integrally formed. Therefore, the phase fluctuation of the timing signals generated and processed by the LSI 100 can be inspected in the LSI 100 with high accuracy and high efficiency without receiving any influence from the characteristic of the transmission line between the LSI 100 and a tester.</p>
申请公布号 JPH08136618(A) 申请公布日期 1996.05.31
申请号 JP19940273912 申请日期 1994.11.08
申请人 HITACHI LTD;HITACHI COMPUT ENG CORP LTD 发明人 NISHIGAMI TAKESHI
分类号 G01R31/28;G06F1/04;G06F1/10;(IPC1-7):G01R31/28 主分类号 G01R31/28
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