| 摘要 |
PROBLEM TO BE SOLVED: To detect the increase of circuit current due to abnormality in a circuit consisting of a MOS transistor with a lower threshold voltage(Vt) composing a semiconductor integrated circuit. SOLUTION: An inspected circuit 230 is composed of an address buffers 231,..., and a timing generator 234 which are circuit blocks consisting of low voltage MOS transisters TLP, TLN. A test enable signal TE to indicate an inspection, a motion selection signal/OP to indicate a motion and block selection signals S11-S61 to select a desired circuit block are supplied. In the case of inspection, in order to supply either of the detection currents I11-I61 of each circuit block selected by turning any of block selection signals S11-S61 and the test enable signal TE into H to the inspection circuit, the inspection circuit is equipped with NMOS transisters THN11-THN61 and PMOS transisters THP 11-THP 61 which are high in voltage. |
