| 摘要 |
<p>PROBLEM TO BE SOLVED: To enable the accurate X-ray measurment related to a sample by excluding the influence of the diffracted X-rays from the sample plate supporting the sample. SOLUTION: An X-ray measuring apparatus is constituted so that the sample S supported by a single crystal samaple plate 21 is irradiated with X-rays and the diffracted X-rays generated from the sample S are detected by a two-dimensional X-ray detector 2 and the coordinates and intensity of the detected difracted X-rays are read by an X-ray reader and operation is executed on the basis of the read result to calculate diffracted X-ray intensity distribution. The coordinate position where the diffracted X-rays issued from the single crystal sample plate 21 are detected by the two-dimensional X-ray detector is recognized as a blank region not allowed to contribute to the operation of the diffracted X-ray intensity distribution. Since the diffracted X-rays from the single crystal sample plate 21 are not included in the operation of X-ray intensity, X-ray intensity distribution can be accurately calculated in relation to only the diffracted X-rays from the sample S.</p> |
