发明名称 METHOD AND DEVICE FOR DIAGNOSING ABNORMAL STATE IN EQUIPMENT AND PRODUCT PROCESS
摘要 <p>PROBLEM TO BE SOLVED: To provide a method and a device capable of improving the identification accuracy of an abnormal state and providing optimum action guidance to be adopted in order to get rid of the abnormal state in a method of diagnosing the abnormal state of object equipment and product processes online or offline. SOLUTION: When a measured abnormal state exceeds a prescribed threshold set up to a level at which the problem of abnormality in equipment or quality is not generated (S2), a state explanation variable and an abnormal objective variable concerning abnormality are found out (S3), one or more factors are analyzed by evaluating the influence relation between an output value and an objective variable by a value F or t used for statistical analysis using a neural network and the influence of an explanation variable on the state objective variable is identified in a form that an unnecessary explanation variable based on the value F or t is abandoned.</p>
申请公布号 JP2000315111(A) 申请公布日期 2000.11.14
申请号 JP19990124718 申请日期 1999.04.30
申请人 NIPPON STEEL CORP 发明人 AKASHI TORU;YASUNAMI TOSHIAKI
分类号 G06F15/18;B21C51/00;G05B23/02;G06N3/00;(IPC1-7):G05B23/02 主分类号 G06F15/18
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