| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing circuit device for a semiconductor integrated circuit for determining whether stress impression is properly performed for a burn-in test. SOLUTION: A periodical signal S is inputted into the first stage of each scan chain, thereby shift-operating each flip-flop circuit with a scan function. As an expected output value of a flip-flop circuit located in the last stage of each scan chain, the output of a flip-flop circuit with the scan function of a scan chain having the same stage number is used, and the output of a flip-flop circuit, having a corresponding period, is used in consideration of periodicity. This enables determination of whether stress is impressed properly on an internal circuit and to output the result of it from a determination signal output terminal 407 to the exterior. |
