| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor device in which damage of terminals caused by a test in a wafer state can be reduced and a time required for a test can be shortened. SOLUTION: This semiconductor device has memory cells storing data, a data input circuit 200 provided with a switching circuit so that the circuit outputs the same signal as a signal when a signal inputted to any one input/ output terminal 602 out of a plurality of input/output terminals 602 is inputted to a plurality of all input/output terminals 602 to succeeding each part at in inputting the data in a test mode of the data for store in the memory cell, and a data output circuit 300 provided with a comparator discriminating whether output data from a plurality of the data input/output terminals 602 in the test mode coincides with each other or not.</p> |
