DIAGNOSTICS FOR INDUSTRIAL PROCESS CONTROL AND MEASUREMENT SYSTEMS
摘要
A field device includes diagnostic circuitry adapted to measure a characteristic related to a process control and measurement system. The measured characteristic is used to provide a diagnostic output indicative of a condition of the process control and measurement system. The measured characteristic can be provided to a diagnostic module that operates upon the measured characteristic to predict, or otherwise model, a condition of the process control and measurement system.
申请公布号
EP1390822(A1)
申请公布日期
2004.02.25
申请号
EP20020769691
申请日期
2002.05.08
申请人
ROSEMOUNT, INC.
发明人
ERYUREK, EVREN;BORGESON, DALE, W.;PELUSO, MARCOS;ROME, GREGORY, H.;ROPER, WESTON, T.