发明名称 LOW TEMPERATURE PLASMA SI OR SIGE FOR MEMS APPLICATIONS
摘要 A method is provided for making a MEMS structure (69). In accordance with the method, a CMOS substrate (51) is provided which has interconnect metal (53) deposited thereon. A MEMS structure is created on the substrate through the plasma assisted chemical vapor deposition (PACVD) of a material selected from the group consisting of silicon and silicon-germanium alloys. The low deposition temperatures attendant to the use of PACVD allow these materials to be used for MEMS fabrication at the back end of an integrated CMOS process.
申请公布号 KR20050026078(A) 申请公布日期 2005.03.14
申请号 KR20057001759 申请日期 2005.01.31
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 FOERSTNER, JUERGEN, A.;ROOP, RAYMOND, MERVIN;SMITH, STEVEN, M.
分类号 B81B3/00;B81B7/02;B81C1/00;H01H49/00;H01H59/00;(IPC1-7):B81B3/00 主分类号 B81B3/00
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