| 摘要 |
The present invention provides a device, system, and associated methods to actively or passively sample air by directing it onto the surface of a porous light-absorbing semiconductor, for example, a desorption/ionization on porous silicon ("DIOS") chip. Upon adsorption of an analyte, the surface may be analyzed directly by laser desorption/ionization time-of-flight mass spectrometry. Because the process of laser desorption/ionization and subsequent mass detection does not require elevated temperatures, thermal degradation of analytes is avoided.
|
