发明名称 Semiconductor integrated circuit device.
摘要 <p>A semiconductor integrated circuit device comprises a semi-conductor substrate (40) of one conduction type, an epitaxial layer (41) of opposite conduction type formed on the semiconductor substrate (40), buried layer (42) of opposite conduction type located between the semiconductor substrate (40) and the epitaxial layer (41) and at least one circuit element (45, 46, 47, 48) formed in the epitaxial layer (41 ) above the buried layer (42).</p><p>The integrated circuit device also includes a first isolation region (43) which surrounds and is spaced from the buried layer (42) and extends from the surface of the epitaxial layer (41) into the substrate, the at least one circuit element being formed in the epitaxial layer (41) surrounded by the first isolation region (43), and a second isolation region (44) located wtihin the first isolation region (43) extends from the surface of the epitaxial layer (41) into the buried layer (42), at least one circuit element being surrounded by the second isolation region (44).</p>
申请公布号 EP0008903(A1) 申请公布日期 1980.03.19
申请号 EP19790301700 申请日期 1979.08.20
申请人 FUJITSU LIMITED 发明人 FUKUSHIMA, TOSHITAKA
分类号 H01L21/76;H01L21/762;H01L21/763;H01L27/02;H01L27/08;H01L29/74;(IPC1-7):01L27/04;01L21/76 主分类号 H01L21/76
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