发明名称 SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS OF ONE OR MORE MATERIALS
摘要 Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.
申请公布号 HK1216780(A1) 申请公布日期 2016.12.02
申请号 HK20160104571 申请日期 2016.04.21
申请人 LUMINEX CORPORATION 发明人 Wayne D. ROTH D;Edward A. CALVIN A;Charles J. COLLINS J;William R. DEICHER R;Jarden E. KRAGER E;Adam R. SCHILFFARTH R;Ross G. JOHNSON G;Colin D. BOZARTH D;Victor SELVARAJ;Eric D. SMITH D;Nicolas F. ARAB F;Bruce J. C. BERNARD JC;Donald A. CONNER A;Robert S. ROACH S;David L. SMITH L
分类号 G01N 主分类号 G01N
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