| 摘要 |
PURPOSE:To easily separate a semiconductor integrated circuit device from a jig and to reduce the time directly required in evaluation and selection by half, by adding a mechanism for raising the semiconductor integrated circuit device to an apparatus for evaluating and selecting said device. CONSTITUTION:When an IC 14 as an element is measured, an operating lever 1 is lowered to lower a pressing pad 11 and the device 14 is inserted in the hole 12 of a measuring board 13 to bring the IC 14 into contact with the electrode 15 of the board 13. At this time, a simultaneously raised pad 2 is lowered and present at a position separated from the device 14. Next, the lever 1 is raised after the finish of measurement to separate the pressing pad 11 from the device 14 and the raising pad 2 is pushed in the hole 12 of the board 13 from below and levitates the device 14 from the board 13 by about 1-2mm to allow the device 14 easy to grasp. By this method, the time directly required in evaluation and selection can be reduced by half.
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