发明名称 FET SEMICONDUCTOR DEVICE
摘要 Field effect semiconductor device (I) uses a two-dimensional electron gas (2 DEG.). (I) comprises (a) a semi-insulating GaAs substrate ; (b) an intrinsic-type GaAs active layer formed on (a) ; (c) a super- lattice structure layer comprising (i) a first intrinsic-type AlAs thin layer formed on (b), (ii) a GaAs thin well layer formed on (i), a second undoped GaAs layer and an atomic plane of dopant atoms formed between the first and second undoped GaAs layers ; (d) a second intrinsic-type AlAs thin layer formed on layer (ii), forming a quantum well ; (e) a doped AlGaAs layer formed on layer (c) ; and (f) electrodes for source drain and gate formed on the quantum well.
申请公布号 KR890004959(B1) 申请公布日期 1989.12.02
申请号 KR19860001428 申请日期 1986.02.28
申请人 FUJITSU CO.LTD. 发明人 ISIGAWA DOMONORI;SASA SIGEHIKO;HIYAMIZU SATOSHI
分类号 H01L29/812;H01L21/338;H01L29/205;H01L29/36;H01L29/778;(IPC1-7):H01L29/76 主分类号 H01L29/812
代理机构 代理人
主权项
地址