发明名称 Thin film semiconductor device and method of fabricating the same
摘要 A thin film transistor and a method of fabricating the transistor are disclosed. The gate electrode of this thin film transistor is made small in thickness so that active hydrogen for hydrogenating passivation can penetrate in a surface layer of channel region having substantially uniform thickness, through the gate electrode. Thus, hydrogenation can be effectively carried out for the thin film transistor, independently of the length of a channel formed in the transistor.
申请公布号 US4943837(A) 申请公布日期 1990.07.24
申请号 US19880166518 申请日期 1988.03.10
申请人 HITACHI, LTD. 发明人 KONISHI, NOBUTAKE;ONO, KIKUO;SUZUKI, TAKAYA;MIYATA, KENJI
分类号 H01L21/205;H01L21/336;H01L27/12;H01L29/423;H01L29/78;H01L29/786 主分类号 H01L21/205
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