发明名称 Automatic frequency follow-up in particle beam metrology upon employment of a modulated primary beam
摘要 A method and apparatus provide compensation of frequency drift phenomenon of a signal to be investigated in an electron beam measuring unit. A regulating signal is acquired from the signal to be investigated and the modulation frequency (fb) of a beam blanking generator in the electron beam measuring arrangement is modified therewith in accordance with the frequency drift in the investigated signal.
申请公布号 US4972142(A) 申请公布日期 1990.11.20
申请号 US19880251371 申请日期 1988.09.30
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 BRUST, HANS D.
分类号 G01N23/22;G01Q30/02;G01R19/00;G01R31/302;G01R31/305;H01J37/26;H01J37/28;H01L31/00 主分类号 G01N23/22
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