发明名称 TEST SIGNAL INSERTION SYSTEM
摘要 PURPOSE:To eliminate the need for a changeover switch and to input a pure test signal in the test signal insertion system in which a signal processing circuit for a current output type solid-state image pickup element is adjusted. CONSTITUTION:A horizontal signal selection switch 1-3 is connected to an output line 1-4 and an output signal of a solid-state image pickup element 1 reading a picture element section 1-1 by the X-Y address system is inputted to a preamplifier 2 via a video signal line 3 and a test signal line 4 through which a test signal is sent via a resistor 7 and a diode 8 is connected to the video signal line 3. In the case of the test, all the horizontal signal selection switches 1-3 are opened and then the test signal is sent while the output signal is not sent.
申请公布号 JPH05115078(A) 申请公布日期 1993.05.07
申请号 JP19910301255 申请日期 1991.10.22
申请人 OLYMPUS OPTICAL CO LTD 发明人 KUBOTA AKIHIRO;KOBAYASHI SUSUMU
分类号 G01R31/00;G01R31/28;H04N5/335;H04N5/365;H04N5/3745;H04N17/00 主分类号 G01R31/00
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