发明名称 FINE SIZE MEASURING INSTRUMENT
摘要 PURPOSE:To selet focal depth corresponding to a difference in the levels of patterns and to measure a distance between patterns independently of the difference in the levels of the patterns. CONSTITUTION:This fine size measuring instrument is provided with a lighting optical system for irradiating a sample 7 with light, an objective lens 6 for converging reflected light from the surface of the sample 7, a 1st image forming optical system for forming the image of reflected light projected from the lens 6, a high N/A CCD camera 10 for observing a sample image through the 1st image forming optical system, a 2nd image forming optical system for forming an image from a part of the reflected light projected from the lens 6, and a low N/A CCD camera 15 for observing a sample image through the 2nd image forming optical system. An image forming iris 13 for the 2nd image forming optical system is arranged on a position conjugate to the pupil surface of the lens 6. Thus an image with focal depth corresponding to the difference in the levels of patterns can be obtained.
申请公布号 JPH06168320(A) 申请公布日期 1994.06.14
申请号 JP19920343297 申请日期 1992.11.30
申请人 NIKON CORP 发明人 YAMADA TOMOAKI;TAZAWA HISASHI
分类号 G02B7/28;G06T1/00;H04N7/18;(IPC1-7):G06F15/64 主分类号 G02B7/28
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