发明名称 AUTOMATIC ERASE OPTIMIZATION CIRCUIT AND METHOD FOR EEPROM
摘要 This system provides a circuit and method which checks the erased state and maintain the optimal erased state of memory cell at selected page. The circuit comprises: an EEPROM which consists of a memory cell array (100), a low and a column decoders (900, 400) , an address buffer (800), a data input/ output buffer (600), and a program latch circuit (1000); an erasion detecting means (200) for outputting detecting signals (4,5) by using output state of the column decoder; a sequential output means (240) for outputting control signals (6,7,8) of high voltage level; and an address counter (500) for providing address counting clocks (9,10,11).
申请公布号 KR940006611(B1) 申请公布日期 1994.07.23
申请号 KR19900012816 申请日期 1990.08.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 IM, HYONG - KYU;LEE, UNG - MU
分类号 G11C17/00;G11C16/02;G11C16/08;G11C16/14;G11C16/16;G11C16/30;(IPC1-7):G11C16/02 主分类号 G11C17/00
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