Pattern generator for semiconductor test unit with address generator section

摘要

The pattern generator includes a sequence control B (8) which produces a control signal (9). A flip-flop circuit network (5) also included distributes the control signal (9) to each of the address generators (10). The sequence control produces the control signal consisting only of one line. The pattern generator is also provided with a sequence storage, a sequence address generator, a repeat counter and a determination circuit.