发明名称 CLEANING AGENT FOR SILICON WAFER
摘要 PROBLEM TO BE SOLVED: To obtain a cleaning agent composition containing a specific fluorine- based surfactant, a phosphonic acid compound and ammonia, having excellent particle-removing performance, free from the problems of the surface damage to a silicon substrate and the deposition of metallic impurities on the substrate and causing no foaming problem. SOLUTION: This cleaning agent contains (A) a fluorine-based surfactant consisting of a compound of the formula [R1 is a fluoroalkyl; R2 is H or a lower alkyl; X is CH2 COO or (CH2 CH2 O)n ((n) is 2-10)], (B) a compound having two or more phosphonic acid groups (e.g. N,N,N',N'-ethylenediaminetetra (methylenephosphonic acid) or nitrilotris (methylenephosphonic acid)), (C) ammonia and optionally further (D) hydrogen peroxide. The amounts of the components A and B are preferably 0.001-0.3wt.% and 0.00005-0.03wt.%, respectively.
申请公布号 JPH09286999(A) 申请公布日期 1997.11.04
申请号 JP19960120776 申请日期 1996.04.19
申请人 KANTO CHEM CO INC;NISSAN CHEM IND LTD 发明人 SHIKINO OSAMU;ISHIKAWA NORIO;MORI KIYOTO;MORIKAWA FUMIHIRO;TSUNODA MAKOTO
分类号 G03F7/40;C11D10/02;H01L21/304;(IPC1-7):C11D10/02 主分类号 G03F7/40
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