发明名称 SINE WAVE PHASE MEASUREMENT APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To attain a highly accurate phase measurement after making resolution of A/D conversion uniform and reducing the resolution. SOLUTION: A to-be-measured sine wave signal is divided into two by a signal divider 10, and the phase of the second sine wave signal is controlled in the phase shift 12. After that, each amplitude of the first sine wave signal and the second sine wave signal is treated by each A/D converter 11, 14, and phase of the to-be-measured sine wave signal is calculated based upon each amplitude of the first and the second sine wave signals.</p>
申请公布号 JPH11160373(A) 申请公布日期 1999.06.18
申请号 JP19970328342 申请日期 1997.11.28
申请人 TOSHIBA CORP 发明人 NAKAHARA TOMOO
分类号 G01R25/00;G01R25/04;G01S7/292;(IPC1-7):G01R25/00 主分类号 G01R25/00
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