| 摘要 |
<p>A method for developing a semiconductor integrated circuit device comprising the first processing steps (S1 to S5) for generating a device model in which the functions of a semiconductor integrated circuit device to be developed are modeled using a function describing language in such a way as to meet the target specifications, the second processing steps (S6 to S8) for designing the circuit of the circuit device based on the device model, and the third processing steps (S21 to S22) for generating a tester model in which the test items corresponding to the target specifications are modeled in parallel with the second processing and for making test design by simulating the tester model and the device model. Since the device model in which the functions of the circuit device are described meets the target specifications of the circuit device, the appropriateness of the tester model, for example, the appropriateness of a test program or the design of a test board for connecting a tester to a semiconductor device can be verified by simulating both the device model and tester model and judging whether or not the device model meets the target specifications from the results of the simulation. Therefore, test design can be carried out before the circuit of the circuit device is designed.</p> |
