发明名称 PROBE FOR PROXIMITY FIELD OPTICAL MICROSCOPE AND ITS MANUFACTURE, AND SCANNING PROXIMITY FIELD OPTICAL MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To observe optical information light of the optical resolving power and a form image, and other physical property information with a probe for a proximity field optical microscope at the same time to stably form a minute opening. SOLUTION: A probe for a proximity field optical microscope has a structure, where a tube 15 has a hook-like shape thermally bent with a minute opening part 12 thermally extended and broken at the tip end par, a part of the tube 15 in a reverse side of this minute opening 12 is removed to form an opening, and a gap of the tip end opening 12 has no shielding object. A proximity field optical microscope is constituted using this probe.
申请公布号 JPH11304823(A) 申请公布日期 1999.11.05
申请号 JP19980239088 申请日期 1998.08.25
申请人 SEIKO INSTRUMENTS INC 发明人 MURAMATSU HIROSHI
分类号 G01B11/30;G01B21/30;G01N37/00;G01Q60/18;G01Q60/22;G01Q70/12;G01Q70/14;(IPC1-7):G01N37/00 主分类号 G01B11/30
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