发明名称 LAMP TEMPERATURE ABNORMALITY DETECTING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To prevent abnormal temperature rising caused by failure of a cooling device or contact failure of a power source connection part by measuring the temperature with a non-contact type temperature measuring means, and comparing the measured temperature with a reference temperature to detect temperature abnormality. SOLUTION: Thermal radiation energy from a metal part at both ends of a Xe lamp is converted into a temperature signal with a temperature detecting part 12, and the temperature signal is sent to a comparing part 14 through an amplifying part 13. The comparing part 14 compares the measured temperature signal with a signal from a reference temperature signal part 15, and if the measured temperature is higher than a reference temperature, a signal of an abnormal temperature rising display is sent to a display part 16. At the same time, a lamp extinguishing signal is sent to a lamp power source control part 17 to control a lamp power source 18 and to put out lights. The temperature detecting part 12 converts thermal radiation energy into an electric signal with a silicon photocell through a protection filter, a condenser lens, a light quantity adjusting plate, and a spectral sensitivity adjusting filter, and directly measures the temperature of the metal part at both ends of the lamp 11.</p>
申请公布号 JP2000012247(A) 申请公布日期 2000.01.14
申请号 JP19980172518 申请日期 1998.06.19
申请人 HITACHI LTD 发明人 TOZAWA TAKESHI;SATO KAZUO;KATO OSAMU
分类号 H05B37/03;(IPC1-7):H05B37/03 主分类号 H05B37/03
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