发明名称 SYSTEM AND METHOD FOR ANALYZING INSPECTION DATA
摘要 PROBLEM TO BE SOLVED: To enable analysis which suitably narrows down generation factors of an outward appearance defect by discriminating and outputting which of 1st to 3rd inspecting processes an outward appearance defect detected in the 3rd inspecting process is detected in for the 1st time. SOLUTION: An analysis unit which processes the inspection result of an inspecting device and outputs the result stores coordinate data of an outward appearance defect detected in a 1st or 2nd inspecting process for the 1st time and compares them with coordinate data of an outward appearance detect detected in the 3rd inspecting process. Then which of the 1st, 2nd, and 3rd inspecting processes the outward appearance detect is detected in for the 1st time is discriminated and outputted. For display, a bar graph is drawn by taking the number of foreign matters on a longitudinal axis 1096 and process names on a lateral axis 1095. The process names are arranged in order from the oldest one from the left. For the bar graph, the sticking processes A, B and C are painted in the same colors by the processes or meshed by layers 1100 to 1102 and the upper and lower lines of the parts are connected by lines.
申请公布号 JP2000200358(A) 申请公布日期 2000.07.18
申请号 JP20000018003 申请日期 2000.01.25
申请人 HITACHI LTD 发明人 ISHIKAWA SEIJI;SAKATA MASAO;NAKAZATO JUN;SHIMOSHA SADAO;NAGATOMO HIROTO;TANIGUCHI YUZO;SATO OSAMU;OKABE TSUTOMU;SAKAMOTO YUZABURO;MURAMATSU KIMIO;MATSUOKA KAZUHIKO;HASHIMOTO TAIZO;OYAMA YUICHI;EBARA YUTAKA;MIYAZAKI ISAO;HANASHIMA SHUICHI
分类号 B65B57/10;G01N21/956;G06T1/00;G06T7/00;H01L21/66;(IPC1-7):G06T7/00 主分类号 B65B57/10
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