发明名称 METHOD OF PRODUCING RELAXED SILICON GERMANIUM LAYERS
摘要 <p>A method for making a semiconductor material, and subsequent structure, including providing a monocrystalline silicon substrate; epitaxially growing, using a source gas of GexHyClz for the germanium component, on the silicon substrate at a temperature in excess of 850 °C a graded Si1-xGex layer with increasing germanium concentration at a gradient of less than 25 % Ge per micron to a final composition in the range of 0.1&lt;=x&lt;=1; and epitaxially growing a layer of semiconductor material on the graded layer.</p>
申请公布号 WO2001022482(A1) 申请公布日期 2001.03.29
申请号 US2000040938 申请日期 2000.09.19
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