发明名称 |
PROBE FOR USE IN LEVEL MEASUREMENT IN TIME DOMAIN REFLECTOMETRY |
摘要 |
A probe for sensing the level of a material or the interface between materials contained in a vessel using Time Domain Reflectometry measurement techniques. The probe comprises a primary conductive rod and at least two secondary conductive rods in spaced relationship with the primary conductive rod for reducing loss of TDR signals propagating through the probe.
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申请公布号 |
CA2388324(A1) |
申请公布日期 |
2003.11.30 |
申请号 |
CA20022388324 |
申请日期 |
2002.05.31 |
申请人 |
SIEMENS MILLTRONICS PROCESS INSTRUMENTS INC. |
发明人 |
SHERRARD, WAYNE |
分类号 |
G01F23/284;(IPC1-7):G01F23/22 |
主分类号 |
G01F23/284 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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