发明名称 PROBE FOR USE IN LEVEL MEASUREMENT IN TIME DOMAIN REFLECTOMETRY
摘要 A probe for sensing the level of a material or the interface between materials contained in a vessel using Time Domain Reflectometry measurement techniques. The probe comprises a primary conductive rod and at least two secondary conductive rods in spaced relationship with the primary conductive rod for reducing loss of TDR signals propagating through the probe.
申请公布号 CA2388324(A1) 申请公布日期 2003.11.30
申请号 CA20022388324 申请日期 2002.05.31
申请人 SIEMENS MILLTRONICS PROCESS INSTRUMENTS INC. 发明人 SHERRARD, WAYNE
分类号 G01F23/284;(IPC1-7):G01F23/22 主分类号 G01F23/284
代理机构 代理人
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