发明名称 SAMPLE ASSEMBLY WITH AN ELECTROMAGNETIC FIELD TO ACCELERATE THE BONDING OF TARGET ANTIGENS AND NANOPARTICLES
摘要 Described are embodiments of an invention for a sample assembly with an electrical conductor for detection of the antigens by electromagnetic read heads. In one embodiment, a sample assembly includes: a substrate; one or more base layers above the substrate; an outer layer above the one or more base layers; a plurality of sample trenches formed in the outer layer and/or the one or more base layers, each sample trench being characterized by an upper surface, a bottom surface, and a longitudinal axis; an electrical conductor disposed in the substrate, the electrical conductor being configured to generate an electromagnetic field in proximity to the plurality of sample trenches to enhance nanoparticle movement toward the bottom surface of the plurality of sample trenches; and at least one alignment trench formed above the substrate, each alignment trench having a longitudinal axis substantially parallel to a longitudinal axis of at least one of the sample trenches.
申请公布号 US2016274102(A1) 申请公布日期 2016.09.22
申请号 US201615169479 申请日期 2016.05.31
申请人 International Business Machines Corporation 发明人 Bates Allen K.;Haustein Nils;Schwartz Stephen L.;Topol Anna W.;Winarski Daniel J.
分类号 G01N33/543 主分类号 G01N33/543
代理机构 代理人
主权项 1. A sample assembly comprising: a substrate; one or more base layers above the substrate; an outer layer above one or more of the base layers; a plurality of sample trenches formed in the outer layer and/or one or more of the base layers, each sample trench being characterized by an upper surface, a bottom surface, and a longitudinal axis; an electrical conductor disposed in the substrate, the electrical conductor being configured to generate an electromagnetic field in proximity to the plurality of sample trenches to enhance nanoparticle movement toward the bottom surface of the plurality of sample trenches; and at least one alignment trench formed above the substrate, each alignment trench having a longitudinal axis substantially parallel to a longitudinal axis of at least one of the sample trenches.
地址 Armonk NY US