发明名称 |
METHOD OF FABRICATING COMPLEMENTARY MOS TRANSISTOR FOR REMOVING LATCH-UP PHENOMENON |
摘要 |
PURPOSE: A method of fabricating a complementary MOS transistor is provided to form stably a channel region and improve a latch-up channel characteristic by forming a polysilicon layer having a thickness of 5000 angstrom. CONSTITUTION: An insulating layer and a polysilicon layer are formed on a semiconductor substrate. A P-well region and an N-well region are formed by implanting different conductive type impurities into the polysilicon layer. A trench-etching process is performed by using a photoresist layer pattern for exposing an interface between the P-well and the N-well. Boron ions are implanted therein. An insulating layer is deposited thereon. The trench-etching process is performed from by using the photoresist layer pattern for exposing a transistor region. A gate oxide layer is formed thereon. A gate electrode(75) is formed on thereon.
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申请公布号 |
KR100444772(B1) |
申请公布日期 |
2004.08.07 |
申请号 |
KR19970079380 |
申请日期 |
1997.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BYUN, HO MIN;KIM, CHEON SU |
分类号 |
H01L21/328;(IPC1-7):H01L21/328 |
主分类号 |
H01L21/328 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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