Semiconductor devices and semiconductor systems including the same

摘要

A semiconductor system includes a first semiconductor device and a second semiconductor device. The first semiconductor device outputs a first test start signal and a second test start signal. The second semiconductor device includes a first chip and a second chip which are sequentially stacked. The first chip selectively outputs first failure information generated in response to the first test start signal as first selection data, in response to the second test start signal. The second chip selectively outputs second failure information generated in response to the first test start signal as second selection data, in response to the second test start signal.

主权项

1. A semiconductor system comprising:
a first semiconductor device suitable for outputting a first test start signal and a second test start signal; and a second semiconductor device including a first chip and a second chip which are sequentially stacked, wherein the first chip is suitable for selectively outputting first failure information generated in response to the first test start signal as first selection data in response to the second test start signal, wherein the second chip is suitable for selectively outputting second failure information generated in response to the first test start signal as second selection data in response to the second test start signal, wherein the first chip includes a first failure information generator suitable for generating the first failure information including information on a normality/abnormality of a first memory cell array in response to the first test start signal.